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It becomes common requirement to comply with ISO26262 for functional safety in automotive systems. This work presents a safety mechanism achieving ISO26262 ASIL B on quad-core Cortex-A57 and quad-core Cortex-A53 in R-Car third generation SoC. The mechanism consists of hardware built-in self-test (BIST) for fault detection, and time slicing technique for test time optimization. The trade-off between fault detect coverage and test time is a key focus of runtime test design. By controlling number of test patterns and testing time, 90% of fault detection coverage was measured in 1.28ms of test time without degradation of overall application performance including audio application running on Cortex-A53 core.
The audience will gain a benefit of:
+ Hardware built-in self-test with time slicing technique is an advantaged solution for functional safety.
+ The trade-off between fault detect coverage and test time is a key focus.
+ Separating mission between cores as well as guarantee of CPU state from multi-cache stores is a key requirement.